MountainsSPIP : Scientific analysis software package for Scanning Probe Microscopes

·         Compatible with AFM, STM, SNOM through multichannel data file formats

·         Prepare and clean-up measured data using powerful FFT tools

·         Correct for scanner X-Y non-linearity, tip shape effect, noise, tilt and bow

·         Analyze topography with texture and roughness parameters

·         Analyze particles with shape and volume parameters, apply classifications

·         Analyze nanomechanical properties with a complete force curve spectroscopy, including force-volume, Young’s modulus, stiffness & energies calculation, WLC fitting…

·         Analyze electrical properties with IV curve analysis, event detection and sorting

·         Characterize lattice structures, patterns, periodic features and fibers

·         Full automation features with statistical analysis

·         Powerful reporting environment with multiple export formats

·         For Windows 10/11 64-bit platforms

Applies to: material characterization, solar cells, semiconductors, MEMS, biotechs

Looking for: distributors, expertise

Contact: Mathieu Cognard